This page contains IAV measurement raw data.

Optical Property

Raw data could be found here

Sample and Data File Convention

An acrylic sample convention is composed of 4 digits.

label-batch-panel-piece

Each raw data file is composed of 6 digits. The first digit indicate the type of measurement. The following 4 digits indicate which acrylic sample is adopted. The last digit indicates the number of measurement.

type-label-batch-panel-piece-measurement

A typical convention of raw data look like:

T-B321-5

This means it's the fifth transmission measurement of the sample used for barrel of some IAV, and it's one piece of a panel ( called number 2) of batch 3.

Label	Description
B	The acrylic sample is used for the barrel of IAV
L	The acrylic sample is used for the lids of IAV
R	The acrylic sample is used for the ribs and flanges of IAV
O	The acrylic sample is not used for the above parts of IAV

Nakano uses the same acrylic panels for the ribs and flanges of IAV#1 and IAV#2. If not specified, the label "R" means the acrylic sample is used for both the ribs and flanges of IAV.

Measurement Type	Description	Details
T	Total transmission	PerkinElmer Lambda 650 spectrometer
R	Total reflection	PerkinElmer Lambda 650 spectrometer
D	Diffuse reflection	PerkinElmer Lambda 650 spectrometer
N	Index of refraction	doc:3499
A	Absorption length	doc:3499
O	Other kinds of measurement not mentioned above

Data format

Transmission/Reflection

A typical transmission/reflection spectrum looks like

800 92.4132 0.131976
799 92.446 0.118017
798 92.3688 0.09428

It means

wavelength(nm)

transmission/reflection mean value (%)

RMS (%)

RMS is taken by the average of the value to repeat scanning spectrum three times, then rotate the sample ~90 degree, and finally repeat scanning spectrum three times, again.

If no extra explanation, the optical spectrum of transmission/reflection follows this format. For example, source:IAV/material/optical/T-B112-1.dat

Attenuation Length

wavelength(nm)

Attenuation Length (mm)

+ uncertainty (mm)

- uncertainty (mm)

Index of Refraction

wavelength(nm)

index of refraction

uncertainty

Sample Summary

Sample	Thickness	Manufacturer	Used for	Note
B111	10.14	Liang-Mei	IAV1/2
B112	10.113	Liang-Mei	IAV1/2
L111	15.150	Liang-Mei	IAV1/2

File Summary

File	Collection Data	Note
T-B111-1.dat	20090215	only 3 times average of an orientation. No rotation of the sample
T-B112-1.dat	20090719
T-B211-1.dat	20090719
T-L111-1.dat	20090719
T-L211-1.dat	20090719
T-R111-1.dat	20090706
R-B112-1.dat	20090718
R-L111-1.dat	20090718
D-B112-1.dat	20090718
D-L111-1.dat	20090718
A-B112-1.dat	derived from T-B112-1.dat R-B112-1.dat D-B112-1.dat	doc:3499
A-L111-1.dat	derived from T-L111-1.dat R-L111-1.dat D-L111-1.dat	doc:3499
N-B112-1.dat	derived from T-B112-1.dat R-B112-1.dat D-B112-1.dat	doc:3499
N-L111-1.dat	derived from T-L111-1.dat R-L111-1.dat D-L111-1.dat	doc:3499